DCM-1 DCPD Crack Growth Monitor
Data sheet, features and applications for the DCM-1.
Legacy
DCM-1 DCPD Crack Growth Monitor
The DCM-1 is an advanced DCPD crack growth monitor that uses the pulsed direct-current technique to monitor crack propagation within metal specimens undergoing mechanical testing. Its microprocessor-based design and pulsed-current facility produced a compact, lightweight DC system for laboratory use.
The DCM-1 is a two-channel (reference and specimen) pulsed DCPD unit housed in a portable enclosure that can be bench- or rack-mounted, with a Z8 microprocessor-controlled main unit and a separate DC pre-amplifier unit.
Features
- Sophisticated filtering: 3 positions — out, 20ms or 200ms
- High current output up to 50A, variable in 10mA steps
- External pre-amplifiers for high-SNR signal pickup
- Pulsed DCPD as standard
- Triggering available at peak and trough of the load-cycle waveform input
- Two channels as standard: reference and specimen
Applications
- Slow crack growth
- Crack sizing
- Dynamic crack growth studies
- Crack closure studies
- Crack initiation
- Fatigue crack initiation
- Condition monitoring
- Stress corrosion testing